Publications

Peer-Reviewed Journal Papers Peer-Reviewed Conference Papers Other Papers

Peer-Reviewed Journal Papers

  • [J7] TOSEM Reliable Fix Patterns Inferred from Static Checkers for Automated Program Repair
    Kui Liu, Jingtang Zhang, Li Li, Anil Koyuncu, Dongsun Kim, Chunpeng Ge, Zhe Liu, Jacques Klein, Tegawendé F. Bissyandé.
    Transactions on Software Engineering and Methodology, 2023. , ,
  • [J6] TOSEM The Best of Both Worlds: Combining Learned Embeddings with Engineered Features for Accurate Prediction of Correct Patches
    Haoye Tian, Kui Liu, Yinghua Li, Abdoul Kader Kaboré, Anil Koyuncu, Andrew Habib, Li Li, Junhao Wen, Jacques Klein, Tegawendé F Bissyandé.
    Transactions on Software Engineering and Methodology, 2023. , ,
  • [J5] TOSEM IBIR: Bug Report driven Fault Injection
    Ahmed Khanfir, Anil Koyuncu, Mike Papadakis, Maxime Cordy, Tegawendé F Bissyandé, Jacques Klein, Yves Le Traon.
    Transactions on Software Engineering and Methodology, 2023. , ,
  • [J4] JSS DigBug—Pre/post-processing operator selection for accurate bug localization
    Kisub Kim, Sankalp Ghatpande, Kui Liu, Anil Koyuncu, Dongsun Kim, Tegawendé F Bissyandé, Jacques Klein, Yves Le Traon.
    Journal of Systems and Software , Vol. 189. (2022). , ,
  • [J3] EMSE Where were the repair ingredients for Defects4j bugs?
    Deheng Yang, Kui Liu, Dongsun Kim, Anil Koyuncu, Kisub Kim, Haoye Tian, Yan Lei, Xiaoguang Mao, Jacques Klein, Tegawendé F Bissyandé.
    Empirical Software Engineering , Vol. 26. (2021). , ,
  • [J2] JSS A Critical Review on the Evaluation of Automated Program Repair Systems
    Kui Liu, Li Li, Anil Koyuncu, Dongsun Kim, Zhe Liu, Jacques Klein, Tegawendé F. Bissyandé.
    Journal of Systems and Software , Vol. 171. (2021). , ,
  • [J1] EMSE FixMiner: Mining Relevant Fix Patterns for Automated Program Repair
    Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein, Martin Monperrus and Yves Le Traon.
    Empirical Software Engineering Journal, Vol. 25, pp. 1980-2024 (2020). , ,

  • Peer-Reviewed Conference Papers

  • [C10] ASE Evaluating Representation Learning of Code Changes for Predicting Patch Correctness in Program Repair
    Haoye Tian, Kui Liu, Abdoul Kader Kaboré, Anil Koyuncu, Li Li, Jacques Klein, Tegawendé F. Bissyandé.
    Proceedings of the 35th IEEE/ACM International Conference on Automated Software Engineering, Virtual (Melbourne, Australia), September 21-25, 2020.
    Acceptance rate: 22.5% (93/414). , ,
  • [C9] ICSE On the Efficiency of Test Suite based Program Repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs
    Kui Liu, Shangwen Wang, Anil Koyuncu, Kisub Kim, Tegawendé F. Bissyandé, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao and Yves Le Traon.
    Proceedings of the 42nd International Conference on Software Engineering (ICSE 2020), Seoul, South Korea, May 23–29, 2020.
    Acceptance rate: 20.9% (129/617). , ,
  • [C8] FSE iFixR: Bug Report driven Program Repair
    Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Martin Monperrus, Jacques Klein and Yves Le Traon.
    Proceedings of the 27th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2019), Tallinn, Estonia, 26-30 August, 2019.
    Acceptance rate: 24.4% (74/303). , ,
  • [C7] ISSTA TBar: Revisiting Template-based Automated Repair
    Kui Liu, Anil Koyuncu, Dongsun Kim, Tegawendé F. Bissyandé
    Proceedings of the 28th International Symposium on Software Testing and Analysis (ISSTA 2019), Beijing, China, July 15-19, 2019.
    Acceptance rate: 22.5% (32/142). , ,
  • [C6] ICSE Learning to Spot and Refactor Inconsistent Method Names
    Kui Liu, Dongsun Kim, Tegawendé F. Bissyandé, Taeyoung Kim, Kisub Kim, Anil Koyuncu, Suntae Kim and Yves Le Traon
    Proceedings of the 41st International Conference on Software Engineering, Montréal, QC, Canada, May 25–31, 2019.
    Acceptance rate: 20.6% (109/529). , ,
  • [C5] ICST You Cannot Fix What You Cannot Find! An Investigation of Fault Localization Bias in Benchmarking Automated Program Repair Systems
    Kui Liu, Anil Koyuncu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein and Yves Le Traon.
    Proceedings of the 12th IEEE International Conference on Software Testing, Verification and Validation (ICST 2019), Xi’an, China, April 22-27, 2019.
    Acceptance rate: 28.1% (31/110). , ,
  • [C4] SANER AVATAR : Fixing Semantic Bugs with Fix Patterns of Static Analysis Violations
    Kui Liu, Anil Koyuncu, Dongsun Kim and Tegawendé F. Bissyandé.
    Proceedings of the 26th IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER 2019), Hangzhou, China, February 24-27, 2019.
    Acceptance rate: 30.4% (45/148). , ,
  • [C3] SANER LSRepair: Live Search of Fix Ingredients for Automated Program Repair
    Kui Liu, Anil Koyuncu, Kisub Kim, Dongsun Kim, and Tegawendé Bissyande.
    Proceedings of the 25th Asia-Pacific Software Engineering Conference (APSEC 2018) ERA Track, Nara, Japan, December 4-7, 2018.
    Acceptance rate: 38.9% (14/36). , ,
    Best ERA Paper Award Winner.
  • [C2] ICSME A Closer Look at Real-World Patches
    Dongsun Kim, Li Li, Anil Koyuncu, Tegawendé Bissyande and Yves Le Traon.
    Proceedings of the 34th IEEE International Conference on Software Maintenance and Evolution (ICSME 2018), Madrid, Spain, September 23 – 29, 2018.
    Acceptance rate: 21.3% (37/174). , ,
  • [C1] ISSTA Impact of Tool Support in Patch Construction
    Anil Koyuncu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein, Martin Monperrus, and Yves Le Traon.
    Proceedings of the 26th International Symposium on Software Testing and Analysis (ISSTA 2017), Santa Barbara, California, United States, July 10-14, 2017.
    Acceptance rate: 26% (31/118). , ,

  • Other Papers

  • [O2] FlexiRepair: Transparent Program Repair with Generic Patches
    Anil Koyuncu, Tegawendé F Bissyandé, Jacques Klein, Yves Le Traon.
    Interdisciplinary Centre for Security, Reliability and Trust (SNT), University of Luxembourg, Technical Report TR-SnT-2020-12, Decembre, 2020.
    Resources: ,
  • [O1] D&C: A divide-and-conquer approach to ir-based bug localization
    Anil Koyuncu, Tegawendé F Bissyandé, Dongsun Kim, Kui Liu, Jacques Klein, Martin Monperrus, Yves Le Traon.
    Interdisciplinary Centre for Security, Reliability and Trust (SNT), University of Luxembourg, Technical Report TR-SnT-2019-2, February, 2019.
    Resources: ,